Measurement, Sensor Systems and Applications Conference: Plenary presentations and interactive discussions on submitted papers
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LX
Beihang University, China
AP
PKG
City St George’s, University of London, United Kingdom
O.B.E (Officer of the Order of the British Empire), Fellow of the Royal Academy of Engineering, Publication Officer of IMEKO (International Measurement Confederation), Editor-in-Chief of Measurement: Sensors
PPC
University of Perugia, Italy
President of IMEKO (International Measurement Confederation), IEEE Fellow, Editor-in-Chief of Measurement
PYY
Beihang University, China
Fellow of the Royal Academy of Engineering, IEEE Fellow, TC20 Vice Chairperson of IMEKO (International Measurement Confederation), Editor-in-Chief of Measurement: Energy
DF
University of Trento, Italy
AM
University of Perugia, Italy
Govind Vashishtha, Wrocław University of Science and Technology, Poland
Sumika Chauhan, Wrocław University of Science and Technology, Poland
Vincenzo Paciello, University of Salerno, Italy
Ruoyang Yuan, University of Sheffield, United Kingdom
Zhang Cao, Beihang University, China
Emanuele Rizzuto, University of Rome La Sapienza, Italy
Lijuan Wang, University of Kent, United Kingdom
Gabriel Gomes de Oliveira, State University of Campinas, Brazil
Bonex Mwakikunga, Council for Scientific and Industrial Research, South Africa
Xiangchen QIAN, North China Electric Power University, China
Jiafeng Yao, Nanjing University of Aeronautics and Astronautics, China
Vladimír Haasz, Czech Technical University in Prague, Czechia
Rahul Kumar, Board of Radiation and Isotope Technology, India
Pranay P. Morajkar, Goa University, India
Lusheng Zhai, Tianjin University, China
Cui Shan, National Metrology Centre, Singapore
Nan Li, Xidian University, China
Feng Guo, Shandong University, China
Sergej Hloch, Technical University of Košice, Slovakia
Stefano Rinaldi, University of Brescia, Italy
Andrea Mariscotti, University of Genoa, Italy
Zhenyu Zhao, National University of Singapore, Singapore
Wuliang Yin, University of Manchester, United Kingdom
Mehri Makki Alamdari, University of New South Wales, Australia
Bofeng Bai, Xi'an Jiaotong University, China
Wu Zhou, University of Shanghai for Science and Technology, China
Haigang Wang, Chinese Academy of Sciences, China
Yan Gao, Chinese Academy of Sciences, China
Shizhe Feng, Hebei University of Technology, China
Tongyu Liu, Shandong Academy of Sciences, China
András Retzler, Ghent University, Belgium
Shengnan Wang, China Jiliang University, China
Yifei Yu, Huazhong University of Science and Technology, China
Valnei Smarcaro da Cunha, National Institute of Metrology Quality and Technology, Brazil
Xicai (Alex) Yue, University of the West of England, United Kingdom
Anna Hajduk, Elsevier, UK
Pengcheng Du, Beihang University, China
Hannah Zhang, Elsevier, China
Preethi Jayendran, Elsevier, India
Chris Holmkvist, Elsevier, UK
Ella Li, Elsevier, China